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Abstract:

The Perkin-Elmer infrared microspectrometer consists of a basic, double-beam spectrometer M 13, on which a microscopical system model 85 with reflecting optics can be mounted. The microspectrometer can be used only for single-beam measurements. Pressed in a K Br-pellet, with a radius of 0.5 mm., the amount of sample of a pure material can be decreased to 2 micrograms. A sample with different paint-layers can be embedded in a wax with little infrared absorption and can be cut with the help of a microtome in slices with a thickness of 20 microns. Every paint-layer can be measured separately by means of an adjustable diaphragm in the microscope. A sample area of 37.5 × 500 microns is sufficient to obtain an identifiable spectrum.